What is SEM?

In a scanning electron microscope (SEM) electrons are used for imaging in a similar way that light microscopes use visible light. The optimal resolution of an imaging instrument depends mainly on the wavelength of the medium. Since the wavelength of electrons is much smaller than the wavelength of light, the resolution of an electron microscope is superior to that of a light microscope. In fact, it is usually more than 1,000 times better.

In this type of electron microscope, the electron beam scans the sample in a raster pattern. Electrons are generated at the top of the column by the electron source. These are emitted when their thermal energy overcomes the work function of the source material. They are then accelerated and attracted by the positively-charged anode. You can find a more detailed description of the different types of electron sources and their characteristics in this guide.

 

Supplies

The ARF has purchased a small set of starter supplies so that our researchers can determine which SEM supplies are best suited for their work. Please note which of ARF's supplies you have borrowed and please replenish our supplies when you purchase your own. ARF purchased supplies from TedPella.com

Count   Product # Description  
1   116 BAMBOO SPLINTS 6"LG,PKG/100  
1   15310-4 MULTI PIN STUB HOLDER, M4  
1   16053 PELCO CONDUCTIVE GRAPHITE,30G  
1   16084-1 PELCO TABS,12MMOD.PK/100  
1   16084-7 CARBON COND.TAPE 12MM X 5M  
50   16111 PIN MOUNT AL.12.7X11MM,8MM PIN  
2   16160 UNIV SPEC MOUNT HOLDER & BOX  
2   16166 UNIVERSAL SPECIMEN HOLDER  
2   16166-2 VINYL END CAP ,RED, 1"  
2   16708 TALL BOX,UNIV SPC HLDR  
1   1663-12 PELCO 12.7MM PIN MNT GRIPPER  
       

 

Other SEM units at UC Berkeley